Show simple item record

dc.contributor.authorRohit Dev Gupta
dc.contributor.authorVinayak Eswaran
dc.date.accessioned2017-05-09T00:27:35Z
dc.date.available2017-05-09T00:27:35Z
dc.date.copyrightJune, 2008
dc.date.issued2008
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26285#021002_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/137765
dc.description.abstractCompact thermal models (CTMs) are simplified multi-nodal thermal resistor network representations of the detailed material and geometric structure of the electronic package. CTMs predict the thermal response of the package, in various environments, to within an accuracy of 2%. The junction temperature of the package is typically obtained by solving the linear algebraic network equations of the CTM, with the heat transfer to the ambience modeled by a convection coefficient obtained from handbooks, assuming identical ambient conditions imposed on all nodal surfaces. This approach may give misleading results as the ambience at each nodal surface can differ depending on the cooling flow patterns at that surface. In this work, a methodology is presented where the network equations of the CTM are integrated into the governing fluid flow and energy equations solved by computational fluid dynamics (CFD). The CTM+CFD approach predicts a significantly (20–30%) higher junction temperature as compared to the conventional CTM network solver method, even when the convection coefficient used in the latter case is obtained more accurately from CFD, rather than from handbook correlations. It is also found that CFD computations assuming uniform flux at the package surfaces (and ignoring the internal resistance of the package) vastly under-predict the junction temperature. The new approach offers a promising alternative for electronic package thermal design and is highly advantageous where the internal geometric and material configurations are not known due to proprietary concerns.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleIntegrating Compact Thermal Models in CFD Simulations of Electronic Packages
dc.typeJournal Paper
dc.journal.volume130
dc.journal.issue2
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.2837511
dc.journal.fristpage21002
dc.identifier.eissn1043-7398
dc.keywordsFlow (Dynamics)
dc.keywordsTemperature
dc.keywordsComputation
dc.keywordsEquations
dc.keywordsJunctions
dc.keywordsNetworks
dc.keywordsElectronic packages
dc.keywordsComputational fluid dynamics
dc.keywordsHeat transfer
dc.keywordsBoundary-value problems
dc.keywordsEngineering simulation AND Heat
dc.treeJournal of Electronic Packaging:;2008:;volume( 130 ):;issue: 002
dc.contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record