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dc.contributor.authorK. Ramakrishna
dc.contributor.authorBahgat G. Sammakia
dc.contributor.authorJ. Richard Culham
dc.contributor.authorYogendra K. Joshi
dc.date.accessioned2017-05-09T00:19:36Z
dc.date.available2017-05-09T00:19:36Z
dc.date.copyrightJune, 2006
dc.date.issued2006
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26263#101_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/133537
dc.description.abstractSince its inception 20 years ago, ITherm, The Intersociety Conference on Thermal, Mechanical, and Thermomechanical Phenomena in Electronic Systems, has been addressing recent advances in the area of thermal management, mechanical, and thermomechanical issues in electronic packages and systems. The conference has enjoyed the support of IEEE CPMT Society, which is its prime sponsor, and the ASME Heat Transfer Division's K-16 Committee on Cooling of Electronic Equipment. During these 20 years, ITherm has steadily grown and maintained a good balance of papers presented in the areas of thermal, mechanical, and emerging technologies. It has become a practice to publish selected papers from ITherm conferences in IEEE Transactions Components and Packaging Technologies. For the first time some of these papers are published in the Journal of Electronic Packaging with contributions from Thermal Management and Emerging Technologies Tracks of ITherm 2004. Of the 14 papers originally invited, 11 appear in this issue after peer review. A brief summary of these papers follows.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleSpecial Issue With Contributions From ITherm 2004
dc.typeJournal Paper
dc.journal.volume128
dc.journal.issue2
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.2188607
dc.journal.fristpage101
dc.identifier.eissn1043-7398
dc.keywordsFlow (Dynamics)
dc.keywordsHeat
dc.keywordsTemperature
dc.keywordsHeat transfer
dc.keywordsCooling
dc.keywordsVapors
dc.keywordsSemiconductors (Materials)
dc.keywordsMeasurement
dc.keywordsAutomatic control
dc.keywordsTurbulence
dc.keywordsDielectric materials
dc.keywordsComputer simulation
dc.keywordsReynolds number
dc.keywordsHeat conduction
dc.keywordsElectronic packaging
dc.keywordsFlux (Metallurgy)
dc.keywordsSheet metal
dc.keywordsSimulation
dc.keywordsThick films
dc.keywordsHeat shielding
dc.keywordsFlow visualization
dc.keywordsPhonons
dc.keywordsBubbles
dc.keywordsAir jets
dc.keywordsEnergy efficiency
dc.keywordsMaterials properties
dc.keywordsThermal conductivity
dc.keywordsSpintronics
dc.keywordsChannel flow
dc.keywordsComputational fluid dynamics
dc.keywordsElectronic equipment
dc.keywordsModeling
dc.keywordsNanoscale phenomena
dc.keywordsNatural convection
dc.keywordsNozzles
dc.keywordsVibration
dc.keywordsData centers
dc.keywordsDiamonds
dc.keywordsElectronic systems
dc.keywordsEquations
dc.keywordsFailure analysis
dc.keywordsHeat sinks
dc.keywordsJunctions
dc.keywordsPressure drop
dc.keywordsSilicon
dc.keywordsSteady state
dc.keywordsThermal management
dc.keywordsThermal resistance
dc.keywordsTransistors
dc.keywordsTunnels
dc.keywordsNucleate boiling
dc.keywordsHeating
dc.keywordsLattice Boltzmann methods
dc.keywordsCritical heat flux
dc.keywordsPrinted circuit boards
dc.keywordsPackaging
dc.keywordsLogistics
dc.keywordsElectronic packages AND Package on package
dc.treeJournal of Electronic Packaging:;2006:;volume( 128 ):;issue: 002
dc.contenttypeFulltext


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