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dc.contributor.authorLeon L. Mishnaevsky
dc.contributor.authorDietmar Gross
dc.date.accessioned2017-05-09T00:14:55Z
dc.date.available2017-05-09T00:14:55Z
dc.date.copyrightSeptember, 2005
dc.date.issued2005
dc.identifier.issn0003-6900
dc.identifier.otherAMREAD-25859#338_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/131110
dc.description.abstractThis paper reviews the theoretical models and methods of analysis of deformation, damage and fracture in thin film/substrate systems. The mechanisms and models of the plastic deformation of thin films, as well as the effects of the dislocation formation and movement on the strength and deformation of thin films are reviewed. The concepts and methods of the theoretical and numerical analysis of the crack propagation in thin films are discussed. The mechanisms and models of cracking, decohesion and delamination, the effects of the substrate properties, as well as of cracking in a thin film between two substrates are analyzed. Continuum mechanical, probabilistic, and lattice models of damage evolution in brittle thin films, the fragmentation of thin films on a substrate, and the formation of the crack patterns are reviewed as well. Numerical models of nanoindentation are discussed. This review article contains 106 references.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleDeformation and Failure in Thin Films/Substrate Systems: Methods of Theoretical Analysis
dc.typeJournal Paper
dc.journal.volume58
dc.journal.issue5
dc.journal.titleApplied Mechanics Reviews
dc.identifier.doi10.1115/1.1995717
dc.journal.fristpage338
dc.journal.lastpage353
dc.identifier.eissn0003-6900
dc.keywordsThin films
dc.keywordsDeformation
dc.keywordsFracture (Process)
dc.keywordsMechanisms
dc.keywordsStress AND Dislocations
dc.treeApplied Mechanics Reviews:;2005:;volume( 058 ):;issue: 005
dc.contenttypeFulltext


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