Show simple item record

dc.contributor.authorGuangjun Zhang
dc.contributor.authorZhenzhong Wei
dc.contributor.authorGraduate Research Assistant
dc.contributor.authorXin Li
dc.contributor.authorGraduate Research Assistant
dc.date.accessioned2017-05-09T00:10:44Z
dc.date.available2017-05-09T00:10:44Z
dc.date.copyrightAugust, 2003
dc.date.issued2003
dc.identifier.issn1087-1357
dc.identifier.otherJMSEFK-27739#617_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/128710
dc.description.abstract3D double-vision inspection is very necessary. It has a larger field of view, and can solve the problem of “blind area” for 3D measurement, as proposed by 3D single-vision inspection. At the beginning of this paper, the principle of structured-light based 3D vision inspection is introduced. Then, a method of gaining calibration points for 3D double-vision inspection system is proposed in detail. In order to gain calibration points with high precision, a double-directional photoelectric aiming device is designed as well, and a method for compensating the position-setting error of the aiming device is described. The coordinates of all calibration points are precisely unified in a world coordinate system. The application of RBF (radial basis function) neural network in establishing the inspection model of structured-light based 3D vision is described in detail. Finally, with the use of the calibration points, the inspection model of 3D double-vision based on RBF neural network is successfully established. The model’s training accuracy is 0.078 mm, and the testing accuracy is 0.084 mm.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.title3D Double-Vision Inspection Based on Structured Light
dc.typeJournal Paper
dc.journal.volume125
dc.journal.issue3
dc.journal.titleJournal of Manufacturing Science and Engineering
dc.identifier.doi10.1115/1.1557292
dc.journal.fristpage617
dc.journal.lastpage623
dc.identifier.eissn1528-8935
dc.keywordsInspection
dc.keywordsCalibration
dc.keywordsArtificial neural networks AND Testing
dc.treeJournal of Manufacturing Science and Engineering:;2003:;volume( 125 ):;issue: 003
dc.contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record