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dc.contributor.authorReena Cole
dc.contributor.authorMark Davies
dc.contributor.authorJeff Punch
dc.date.accessioned2017-05-09T00:09:50Z
dc.date.available2017-05-09T00:09:50Z
dc.date.copyrightDecember, 2003
dc.date.issued2003
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26225#480_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/128165
dc.description.abstractElectronic package manufacturers publish thermal characteristics of components, which are measured using standard tests, measuring a thermal resistance value for a single component on a standard test printed circuit board (PCB). This limits the applicability of the characterization, as it does not show what aerodynamic or thermal interaction each package will have in a real system. This paper presents a new board-level electronics system test vehicle consisting of an array of ball grid components on three different effective thermal conductivity multi-layer PCB’s. Aerodynamic and thermal measurements are presented. It appears that PCB’s populated with low profile electronic packages behave like flat plates, leading to the proposition that component temperatures can be calculated using flat plate predictions. It is shown how both the airflow and the board conductivity can have a critical effect on the junction temperature, and a simple design rule is suggested, in terms of influence factors, to take account of these effects. These will lead to better estimates of electronic system reliability in the early part of the design cycle.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleA Board Level Study of an Array of Ball Grid Components—Aerodynamic and Thermal Measurements
dc.typeJournal Paper
dc.journal.volume125
dc.journal.issue4
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.1604811
dc.journal.fristpage480
dc.journal.lastpage489
dc.identifier.eissn1043-7398
dc.keywordsFlow (Dynamics)
dc.keywordsTemperature
dc.keywordsMeasurement
dc.keywordsFlat plates
dc.keywordsJunctions
dc.keywordsThermal resistance
dc.keywordsVehicles
dc.keywordsConductivity
dc.keywordsThermal conductivity
dc.keywordsElectronic systems
dc.keywordsElectronic packages
dc.keywordsElectronics
dc.keywordsAir flow AND Reliability
dc.treeJournal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004
dc.contenttypeFulltext


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