• Login
    View Item 
    •   DSpace Home
    • ASME
    • Applied Mechanics Reviews
    • View Item
    •   DSpace Home
    • ASME
    • Applied Mechanics Reviews
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Contact Mechanics of Rough Surfaces in Tribology: Single Asperity Contact

    Thumbnail
    View/Open
    AMREAD-25710#275_1.pdf (2.387Mb)
    Date
    1996
    Author
    Bharat Bhushan
    Metadata
    Show full item record
    Abstract
    Contact modeling of two rough surfaces under normal approach and with relative motion is carried out to predict the real area of contact which affects friction and wear of an interface. The contact of two macroscopically flat bodies with microroughness is reduced to the contact at multiple asperities of arbitrary shapes. Most of deformation at the asperity contact can be either elastic or elastic-plastic. In this paper, a comprehensive review of modeling of a single asperity contact or an indentation problem is presented. Contact analyses for a spherical asperity/indenter on homogeneous and layered, elastic and elastic-plastic solids with and without tangential loading are presented. The analyses reviewed in this paper fall into two groups: (a) analytical solutions, primarily for elastic solids and (b) finite element solutions, primarily for elastic-plastic problems and layered solids. Implications of these analyses in friction and wear are discussed.
    URI
    http://yetl.yabesh.ir/yetl/handle/yetl/116318
    Collections
    • Applied Mechanics Reviews

    DSpace software copyright © 2002-2015  DuraSpace
    Contact Us | Send Feedback
    Theme by 
    @mire NV
     

     

    Browse

    All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    LoginRegister

    Statistics

    View Usage Statistics

    DSpace software copyright © 2002-2015  DuraSpace
    Contact Us | Send Feedback
    Theme by 
    @mire NV