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dc.contributor.authorA. Zubelewicz
dc.contributor.authorR. Berriche
dc.contributor.authorL. M. Keer
dc.contributor.authorM. E. Fine
dc.date.accessioned2017-05-08T23:29:43Z
dc.date.available2017-05-08T23:29:43Z
dc.date.copyrightSeptember, 1989
dc.date.issued1989
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26110#179_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/105239
dc.description.abstractFatigue lifetimes of lead-low tin solders have been investigated. Results indicate that the Coffin-Manson law does not necessarily fit experimental data. The phenomenon can be correlated with a change in the failure mode as follows: transgranular and mixed for higher strain ranges, and intergranular at lower strains. The present modeling incorporates these micromechanical features, and in addition shows that the variation in the failure mode and in the magnitude of the stresses from varying strain range (during the cyclic process) coincide with each other.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleLifetime Prediction of Solder Materials
dc.typeJournal Paper
dc.journal.volume111
dc.journal.issue3
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.3226531
dc.journal.fristpage179
dc.journal.lastpage182
dc.identifier.eissn1043-7398
dc.keywordsSolders
dc.keywordsFailure
dc.keywordsFatigue
dc.keywordsStress AND Modeling
dc.treeJournal of Electronic Packaging:;1989:;volume( 111 ):;issue: 003
dc.contenttypeFulltext


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