Show simple item record

contributor authorM. Irshidat
contributor authorA. Al-Ostaz
contributor authorA. H.-D. Cheng
date accessioned2017-05-08T21:57:54Z
date available2017-05-08T21:57:54Z
date copyrightDecember 2012
date issued2012
identifier other%28asce%29nm%2E2153-5477%2E0000088.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/67549
description abstractThis paper focuses on correlating micromorphology and nanomorphology to the performance of nano-enhanced polymers subjected to blast loading, studying the behavior of these materials at high strain rates, and evaluating the effect of voids’ size and amount on the strain rate sensitivity of nanomaterials. Three polyurea-based elastomeric materials are investigated in this study: unreinforced polyurea, exfoliated graphene nanoparticle (xGnP)–reinforced polyurea, and polyhedral oligomeric silsesquioxane (POSS)–reinforced polyurea. Three-dimensional computed tomography scan images show large amounts of randomly distributed voids in the materials. The study found that POSS-reinforced polyurea has the largest number but the smallest void size among the three tested materials. Computational parametric evaluation is conducted to investigate the effect of such defects on the behavior of these materials. Dynamic nonlinear explicit finite-element code AUTODYN is used to perform three-dimensional analyses for a representative volume element model. The results show that the rate dependence mechanism relies not only on the void ratio but also on void size.
publisherAmerican Society of Civil Engineers
titleCorrelating Micromorphology and Nanomorphology to High Strain Rate Performance of Nanoparticle Reinforced Polymeric Materials
typeJournal Paper
journal volume2
journal issue4
journal titleJournal of Nanomechanics and Micromechanics
identifier doi10.1061/(ASCE)NM.2153-5477.0000045
treeJournal of Nanomechanics and Micromechanics:;2012:;Volume ( 002 ):;issue: 004
contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record