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contributor authorArindam Nath
contributor authorSudarshan Dhua
date accessioned2025-08-17T22:44:03Z
date available2025-08-17T22:44:03Z
date copyright6/1/2025 12:00:00 AM
date issued2025
identifier otherJENMDT.EMENG-8245.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4307364
description abstractThe study investigates the reflection and refraction phenomena of shear horizontal (SH) waves at the interface between two piezoelectric media in the scope of surface-interface elasticity. In micro/nano smart structures such as surface acoustic wave devices, where the ratio of the area of the surface/interface to the bulk is large, the produced field quantities are affected by surface/interface electromechanical properties. Derivation of the surface strain energy density, surface stress tensor, and surface kinetic energy density has been achieved using the Gurtin-Murdoch model and the Eremeyev model, which take into consideration the surface-interface elasticity. The expressions of the amplitudes of reflected and refracted waves have been derived analytically using the governing equations for a piezoelectric medium. Numerical simulations and graphical interpretations have been carried out to observe the effects of surface-interface elasticity on wave propagation. It has been found that the wave’s amplitude ratios are sensitive to the change in surface-interface elasticity parameters. The investigation may have possible applications in signal processing, transduction, and frequency shifting (a difference in the velocity of surface waves and controlling the selectivity of a filter compensation) of individual devices.
publisherAmerican Society of Civil Engineers
titleSH-Wave Scattering at the Boundary between Two Piezoelectric Half-Spaces with Surface-Interface Energy
typeJournal Article
journal volume151
journal issue6
journal titleJournal of Engineering Mechanics
identifier doi10.1061/JENMDT.EMENG-8245
journal fristpage04025021-1
journal lastpage04025021-18
page18
treeJournal of Engineering Mechanics:;2025:;Volume ( 151 ):;issue: 006
contenttypeFulltext


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