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contributor authorMurino, Loredana
contributor authorAmato, Umberto
contributor authorCarfora, Maria Francesca
contributor authorAntoniadis, Anestis
contributor authorHuang, Bormin
contributor authorMenzel, W. Paul
contributor authorSerio, Carmine
date accessioned2017-06-09T17:25:15Z
date available2017-06-09T17:25:15Z
date copyright2014/02/01
date issued2013
identifier issn0739-0572
identifier otherams-84925.pdf
identifier urihttp://onlinelibrary.yabesh.ir/handle/yetl/4228315
description abstractethods coming from statistics and pattern recognition to estimate the cloud mask from radiance measured by visible and infrared sensors on board satellites are gaining greater consideration for their ability to properly exploit the increasing number of channels available with current and next-generation sensors. Endowed with physical arguments, they give rise to robust methods for accurately estimating the cloud mask. Application of such classification methods to Moderate Resolution Imaging Spectroradiometer (MODIS) data is discussed in this paper. Three different types of MODIS datasets are considered: synthetic (radiance is simulated by proper radiative transfer models); annotated (real MODIS data labeled by a meteorologist as clear or cloudy); and real MODIS data, whose truth is obtained from the official MODIS cloud mask product. A full assessment of the MODIS spectral bands is performed, aimed at understanding the role of the spectral bands in detecting clouds and at achieving top performance with very few properly chosen spectral channels. Local methods that use spatial correlation of images to improve classification, reducing the pseudonuisance of nonlocal methods, have also been tested on real data.
publisherAmerican Meteorological Society
titleCloud Detection of MODIS Multispectral Images
typeJournal Paper
journal volume31
journal issue2
journal titleJournal of Atmospheric and Oceanic Technology
identifier doi10.1175/JTECH-D-13-00088.1
journal fristpage347
journal lastpage365
treeJournal of Atmospheric and Oceanic Technology:;2013:;volume( 031 ):;issue: 002
contenttypeFulltext


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