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contributor authorHoffman, R. N.
contributor authorLeidner, S. M.
contributor authorHenderson, J. M.
contributor authorAtlas, R.
contributor authorArdizzone, J. V.
contributor authorBloom, S. C.
date accessioned2017-06-09T14:35:18Z
date available2017-06-09T14:35:18Z
date copyright2003/05/01
date issued2003
identifier issn0739-0572
identifier otherams-2228.pdf
identifier urihttp://onlinelibrary.yabesh.ir/handle/yetl/4158712
description abstractIn this study, a two-dimensional variational analysis method (2DVAR) is applied to select a wind solution from NASA Scatterometer (NSCAT) ambiguous winds. A 2DVAR method determines a ?best? gridded surface wind analysis by minimizing a cost function. The cost function measures the misfit to the observations, the background, and the filtering and dynamical constraints. The ambiguity closest in direction to the minimizing analysis is selected. The 2DVAR method, sensitivity, and numerical behavior are described. 2DVAR is used with both NSCAT ambiguities and NSCAT backscatter values. Results are roughly comparable. When the background field is poor, 2DVAR ambiguity removal often selects low probability ambiguities. To avoid this behavior, an initial 2DVAR analysis, using only the two most likely ambiguities, provides the first guess for an analysis using all the ambiguities or the backscatter data. 2DVAR and median filter-selected ambiguities usually agree. Both methods require horizontal consistency, so disagreements occur in clumps, or as linear features. In these cases, 2DVAR ambiguities are often more meteorologically reasonable and more consistent with satellite imagery.
publisherAmerican Meteorological Society
titleA Two-Dimensional Variational Analysis Method for NSCAT Ambiguity Removal: Methodology, Sensitivity, and Tuning
typeJournal Paper
journal volume20
journal issue5
journal titleJournal of Atmospheric and Oceanic Technology
identifier doi10.1175/1520-0426(2003)20<585:ATDVAM>2.0.CO;2
journal fristpage585
journal lastpage605
treeJournal of Atmospheric and Oceanic Technology:;2003:;volume( 020 ):;issue: 005
contenttypeFulltext


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