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Research of Underfill Delamination in Flip Chip by the J-Integral Method
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Fracture mechanics approaches have been used to study reliability problems in electronic packages, in particular, adhesion related failure in flip chip assembly. It was verified in this work ...
Reliability Investigation for Encapsulated Isotropic Conductive Adhesives Flip Chip Interconnection
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Isotropic conductive adhesives (ICA) are gaining more and more application interests in electronic manufacturing, however, their failure mechanism is not been fully understood. In this paper we ...
Quantitative Mechanism of Significant Benefits of Underfill in Flip-Chip Assemblies
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: The thermal fatigue failure of SnPb solder joints of flip chip on board with and without underfill for two types of flip-chip packages was investigated by conducting thermal cycling test, ...