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Interface Reliability Modeling of Coaxial Through Silicon Via Based on WOA-BP Neural Network
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Due to the complex structure and thermal mismatch of coaxial through silicon via (TSV), cracks easily occur under thermal load, leading to interface delamination or spalling failure. The reliability issue of coaxial TSV ...
Acoustic Wave Manipulation by Phase Conjugate Metasurface
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Metasurfaces are advantageous in wavefront manipulation owing to their compact and flat nature. Particularly, ultrathin and completely smooth metasurfaces with giant phase delay and perfect impedance match are critically ...
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