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Spectral Imaging and Computer Vision for High-Throughput Defect Detection and Root-Cause Analysis of Silicon Nanopillar Arrays
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Far-field spectral imaging, coupled with computer vision methods, is demonstrated as an effective inspection method for detection, classification, and root-cause analysis of manufacturing defects in large area Si nanopillar ...
Thermal Transport in Nanoparticle Packings Under Laser Irradiation
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Nanoparticle heating due to laser irradiation is of great interest in electronic, aerospace, and biomedical applications. This paper presents a coupled electromagnetic-heat transfer model to predict the temperature ...