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    Thermal Strain Measurements of Solder Joints in Second Level Interconnections Using Moire Interferometry 

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 001:;page 88
    Author(s): Yifan Guo; Charles G. Woychik
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Low cycle fatigue of solder joints is one of the major kinds of failures in second level interconnections of an electronic package. The fatigue failure is caused by thermal strains which are ...
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    A Study of Process-Induced Residual Stress in PBGA Packages 

    Source: Journal of Electronic Packaging:;2000:;volume( 122 ):;issue: 003:;page 262
    Author(s): Zhu Wu; Yifan Guo; Jian Lu
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Process-induced residual stresses can play a significant role in the reliability of electronic components and packages. In this paper, a practical method is developed to determine residual stresses ...
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    Finding the Constitutive Relation for a Specific Elastomer 

    Source: Journal of Electronic Packaging:;1993:;volume( 115 ):;issue: 003:;page 329
    Author(s): Yun Ling; Peter A. Engel; Wm. L. Brodskey; Yifan Guo
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The main purpose of this study was to determine a suitable strain energy function for a specific elastomer. A survey of various strain energy functions proposed in the past was made. For ...
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