Search
Now showing items 1-1 of 1
Nanoindentation Measurements on Low-k Porous Silica Thin Films Spin Coated on Silicon Substrates
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: MEMS (MicroElectroMechanical Systems) are composed of thin films and composite nanomaterials. Although the mechanical properties of their constituent materials play an important role in controlling ...
CSV
RIS