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Reliability Modeling of Lead-Free Solder Joints in Wafer-Level Chip Scale Packages
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Board-level thermomechanical fatigue lifetimes of five different wafer-level chip scale packages (WCSPs) with lead-free solder joints were studied by both experiment and finite element method ...
Modeling of Surface Modified Layers in the Presence of Surface Irregularities
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Finite element calculations that examine the effects of surface modification on the deformation produced by pure rolling contact are presented. The model simulates the repeated, two-dimensional ...