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    A Study of Deformation Mechanism During Nanoindentation Creep in Tin-Based Solder Balls 

    Source: Journal of Electronic Packaging:;2007:;volume( 129 ):;issue: 001:;page 71
    Author(s): Tadahiro Shibutani; Qiang Yu; Masaki Shiratori
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: As the shrinkage and integration of devices, the creep behavior of tin-based alloys becomes important with microscales. In this paper, the behavior of creep deformation in solder alloys during ...
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    Reliability Evaluation on Deterioration of Power Device Using Coupled Electrical-Thermal-Mechanical Analysis 

    Source: Journal of Electronic Packaging:;2010:;volume( 132 ):;issue: 003:;page 31012
    Author(s): Takashi Anzawa; Masanori Yamagiwa; Tadahiro Shibutani; Masaki Shiratori; Qiang Yu
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper presents a simulation method to evaluate the thermal fatigue life of a power module. A coupled electrical-thermal analysis was performed to obtain the nonuniform temperature distribution ...
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