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    Quantitative Stability Analysis Using Real Valued Frequency Response Data 

    Source: Journal of Engineering for Gas Turbines and Power:;2013:;volume( 135 ):;issue: 012:;page 121601
    Author(s): Schmid, Martin; Blumenthal, Ralf S.; Schulze, Moritz; Polifke, Wolfgang; Sattelmayer, Thomas
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Models for the analysis of thermoacoustic instabilities are conveniently formulated in the frequency domain. In this case one often faces the difficulty that the response behavior of some elements of the system is only ...
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    Revisiting Microstructure Sensor Responses with Implications for Double-Diffusive Fluxes 

    Source: Journal of Atmospheric and Oceanic Technology:;2013:;volume( 030 ):;issue: 008:;page 1907
    Author(s): Sommer, Tobias; Carpenter, Jeffrey R.; Schmid, Martin; Lueck, Rolf G.; Wüest, Alfred
    Publisher: American Meteorological Society
    Abstract: hin high-gradient interfaces that occur naturally within double-diffusive staircases are used to estimate the response characteristics of temperature and conductivity microstructure sensors. The knowledge of these responses ...
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    Global Climate 

    Source: Bulletin of the American Meteorological Society:;2020:;volume( 101 ):;issue: 008:;page S9
    Author(s): Ades, M.;Adler, R.;Allan, Rob;Allan, R. P.;Anderson, J.;Argüez, Anthony;Arosio, C.;Augustine, J. A.;Azorin-Molina, C.;Barichivich, J.;Barnes, J.;Beck, H. E.;Becker, Andreas;Bellouin, Nicolas;Benedetti, Angela;Berry, David I.;Blenkinsop, Stephen;Bock, Olivier.;Bosilovich, Michael G.;Boucher, Olivier.;Buehler, S. A.;Carrea, Laura.;Christiansen, Hanne H.;Chouza, F.;Christy, John R.;Chung, E.-S.;Coldewey-Egbers, Melanie;Compo, Gil P.;Cooper, Owen R.;Covey, Curt;Crotwell, A.;Davis, Sean M.;de Eyto, Elvira;de Jeu, Richard A. M;VanderSat, B.V.;DeGasperi, Curtis L.;Degenstein, Doug;Di Girolamo, Larry;Dokulil, Martin T.;Donat, Markus G.;Dorigo, Wouter A.;Durre, Imke;Dutton, Geoff S.;Duveiller, G.;Elkins, James W.;Fioletov, Vitali E.;Flemming, Johannes;Foster, Michael J.;Frey, Richard A.;Frith, Stacey M.;Froidevaux, Lucien;Garforth, J.;Gupta, S. K.;Haimberger, Leopold;Hall, Brad D.;Harris, Ian;Heidinger, Andrew K;Hemming, D. L.;Ho, Shu-peng (Ben);Hubert, Daan;Hurst, Dale F.;Hüser, I.;Inness, Antje;Isaksen, K.;John, Viju;Jones, Philip D.;Kaiser, J. W.;Kelly, S.;Khaykin, S.;Kidd, R.;Kim, Hyungiun;Kipling, Z.;Kraemer, B. M.;Kratz, D. P.;La Fuente, R. S.;Lan, Xin;Lantz, Kathleen O.;Leblanc, T.;Li, Bailing;Loeb, Norman G;Long, Craig S.;Loyola, Diego;Marszelewski, Wlodzimierz;Martens, B.;May, Linda;Mayer, Michael;McCabe, M. F.;McVicar, Tim R.;Mears, Carl A.;Menzel, W. Paul;Merchant, Christopher J.;Miller, Ben R.;Miralles, Diego G.;Montzka, Stephen A.;Morice, Colin;Mühle, Jens;Myneni, R.;Nicolas, Julien P.;Noetzli, Jeannette;Osborn, Tim J.;Park, T.;Pasik, A.;Paterson, Andrew M.;Pelto, Mauri S.;Perkins-Kirkpatrick, S.;Pétron, G.;Phillips, C.;Pinty, Bernard;Po-Chedley, S.;Polvani, L.;Preimesberger, W.;Pulkkanen, M.;Randel, W. J.;Rémy, Samuel;Ricciardulli, L.;Richardson, A. D.;Rieger, L.;Robinson, David A.;Rodell, Matthew;Rosenlof, Karen H.;Roth, Chris;Rozanov, A.;Rusak, James A.;Rusanovskaya, O.;Rutishäuser, T.;Sánchez-Lugo, Ahira;Sawaengphokhai, P.;Scanlon, T.;Schenzinger, Verena;Schladow, S. Geoffey;Schlegel, R. W;Schmid, Martin, Eawag;Selkirk, H. B.;Sharma, S.;Shi, Lei;Shimaraeva, S. V.;Silow, E. A.;Simmons, Adrian J.;Smith, C. A.;Smith, Sharon L;Soden, B. J.;Sofieva, Viktoria;Sparks, T. H.;Stackhouse, Paul W., Jr.;Steinbrecht, Wolfgang;Streletskiy, Dimitri A.;Taha, G.;Telg, Hagen;Thackeray, S. J.;Timofeyev, M. A.;Tourpali, Kleareti;Tye, Mari R.;van der A, Ronald J.;van der Schalie, Robin, VanderSat B.V.;van der SchrierW. Paul, Gerard;van der Werf, Guido R.;Verburg, Piet;Vernier, Jean-Paul;Vömel, Holger;Vose, Russell S.;Wang, Ray;Watanabe, Shohei G.;Weber, Mark;Weyhenmeyer, Gesa A.;Wiese, David;Wilber, Anne C.;Wild, Jeanette D.;Wong, Takmeng;Woolway, R. Iestyn;Yin, Xungang;Zhao, Lin;Zhao, Guanguo;Zhou, Xinjia;Ziemke, Jerry R.;Ziese, Markus
    Publisher: American Meteorological Society
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