Abstract: Concern about fitnessforservice (FFS) assessments using stochastic analyses for aged pressure equipment with local metal loss has been growing. When a decision must be made regarding whether to run or repair equipment with ...

Abstract: In semiconductor devices, fine patterning can cause structural instability because of intrinsic compressive stress. We studied one such instability phenomenon, outofplane wiggling of a patterned structure with mask–dielectric ...

Abstract: The Master Curve gives the relation between the median of fracture toughness of ferritic steels and the temperature in the ductile–brittle transition temperature region. The procedure used to determine the Master Curve ...