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    Norris–Landzberg Acceleration Factors and Goldmann Constants for SAC305 Lead-Free Electronics 

    Source: Journal of Electronic Packaging:;2012:;volume( 134 ):;issue: 003:;page 31008
    Author(s): Pradeep Lall; Aniket Shirgaokar; Dinesh Arunachalam
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Goldmann constants and Norris–Landzberg acceleration factors for SAC305 lead-free solders have been developed based on principal component regression models (PCR) for reliability prediction and part ...
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    Prognostication Based on Resistance-Spectroscopy and Phase-Sensitive Detection for Electronics Subjected to Shock-Impact 

    Source: Journal of Electronic Packaging:;2012:;volume( 134 ):;issue: 002:;page 21001
    Author(s): Pradeep Lall; Kai Goebel; Ryan Lowe
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Leading indicators of failure have been developed based on high-frequency characteristics, and system-transfer function derived from resistance spectroscopy measurements during shock and vibration. ...
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    Reliability of BGA and CSP on Metal-Backed Printed Circuit Boards in Harsh Environments 

    Source: Journal of Electronic Packaging:;2007:;volume( 129 ):;issue: 004:;page 382
    Author(s): Pradeep Lall; Nokibul Islam; John Evans; Jeff Suhling
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Increased use of sensors and controls in automotive applications has resulted in significant emphasis on the deployment of electronics directly mounted on the engine and transmission. Increased ...
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    Smeared-Property Models for Shock-Impact Reliability of Area-Array Packages 

    Source: Journal of Electronic Packaging:;2007:;volume( 129 ):;issue: 004:;page 373
    Author(s): Pradeep Lall; Dhananjay Panchagade; Yueli Liu; Wayne Johnson; Jeff Suhling
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Portable electronics is subjected to extreme accelerations in shock and drop impact. Product development cycle times and the cost constraints often restrict the number of design variations tested ...
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    Characterization of Compressive Die Stresses in CBGA Microprocessor Packaging Due to Component Assembly and Heat Sink Clamping 

    Source: Journal of Electronic Packaging:;2012:;volume( 134 ):;issue: 003:;page 31005
    Author(s): Jordan C. Roberts; Mohammad Motalab; Safina Hussain; Jeffrey C. Suhling; Richard C. Jaeger; Pradeep Lall
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Microprocessor packaging in modern workstations and servers often consists of one or more large flip chip die that are mounted to a high performance ceramic chip carrier. The final assembly ...
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    Mechanical Design of Electronic Systems 

    Source: Journal of Electronic Packaging:;2010:;volume( 132 ):;issue: 001:;page 16501
    Author(s): James W. Dally; John H. L. Pang; Pradeep Lall; Jeffrey C. Suhling
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Mechanical Design of Electronic Systems,. College House Enterprises, LLC, Knoxville, TN, 2008
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