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RISNanomechanical Properties of SiC Films Grown From C60 Precursors Using Atomic Force Microscopy
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: The mechanical properties of SiC films grown via C60 precursors were determined using atomic force microscopy (AFM). Conventional silicon nitride and diamond-tipped steel AFM cantilevers were ...
Atomic Force Microscope Measurements of the Hardness and Elasticity of Peritubular and Intertubular Human Dentin
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: An atomic force microscope was used to measure the hardness and elasticity of fully-hydrated peritubular and intertubular human dentin. The standard silicon nitride AFM tip and silicon cantilever ...