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    Shearographic and Holographic Assessment of Defective Laminates With Bond-Lines of Different Elasticities 

    Source: Journal of Engineering Materials and Technology:;1995:;volume( 117 ):;issue: 003:;page 322
    Author(s): H. M. Shang; L. M. Tham; F. S. Chau
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: While defects in laminated plates are readily revealed using double-exposure shearography and holography, when an incremental vacuum pressure is applied between the exposures, the apparent defect ...
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