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    Parameterized Modeling of Thermomechanical Reliability for CSP Assemblies 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004:;page 498
    Author(s): Bart Vandevelde; Kouchi (G.Q.) Zhang; Dirk Vandepitte; Martine Baelmans; Jo Caers; Eric Beyne
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Finite element modeling is widely used for estimating the solder joint reliability of electronic packages. In this study, the electronic package is a CSP mounted on a printed circuit board ...
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