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    Iterative and Feedback Control for Hysteresis Compensation in SMA 

    Source: Journal of Dynamic Systems, Measurement, and Control:;2009:;volume( 131 ):;issue: 001:;page 14502
    Author(s): Kam K. Leang; Seth Ashley; Guy Tchoupo
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper investigates the design of an iteration-based controller combined with feedback control to address the positioning error caused by hysteresis in a shape memory alloy (SMA) actuator. ...
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    Design and Analysis of Discrete-Time Repetitive Control for Scanning Probe Microscopes 

    Source: Journal of Dynamic Systems, Measurement, and Control:;2009:;volume( 131 ):;issue: 006:;page 61103
    Author(s): Ugur Aridogan; Yingfeng Shan; Kam K. Leang
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper studies repetitive control (RC) with linear phase lead compensation to precisely track periodic trajectories in piezo-based scanning probe microscopes (SPMs). Quite often, the lateral ...
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    Emerging Challenges of Microactuators for Nanoscale Positioning, Assembly, and Manipulation 

    Source: Journal of Manufacturing Science and Engineering:;2010:;volume( 132 ):;issue: 003:;page 30917
    Author(s): Bijoyraj Sahu; Kam K. Leang; Curtis R. Taylor
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The development of manufacturing tools and processes capable of precisely positioning and manipulating nanoscale components and materials is still in its embryonic stage. Microactuators are emerging ...
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    A Review of Feedforward Control Approaches in Nanopositioning for High-Speed SPM 

    Source: Journal of Dynamic Systems, Measurement, and Control:;2009:;volume( 131 ):;issue: 006:;page 61101
    Author(s): Garrett M. Clayton; Szuchi Tien; Kam K. Leang; Qingze Zou; Santosh Devasia
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Control can enable high-bandwidth nanopositioning needed to increase the operating speed of scanning probe microscopes (SPMs). High-speed SPMs can substantially impact the throughput of a wide ...
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