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RISEnhancing Image Segmentation Model in Computing Void Percentage With Mask RCNN
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Automating quality control has been an ongoing effort, especially when manufacturing large flip-chips. One such method is through employing the convolutional neural network (CNN). This work studied the optimum setup of the ...
Enhancing Image Segmentation Model in Computing Void Percentage With Mask RCNN
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Automating quality control has been an ongoing effort, especially when manufacturing large flip-chips. One such method is through employing the convolutional neural network (CNN). This work studied the optimum setup of the ...