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    Quantitative Interfacial Energy Measurements of Adhesion-Promoted Thin Copper Films by Supercritical Fluid Deposition on Barrier Layers 

    Source: Journal of Engineering Materials and Technology:;2010:;volume( 132 ):;issue: 002:;page 21014
    Author(s): Christos F. Karanikas; Han Li; James J. Watkins; Joost J. Vlassak
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A fivefold increase in adhesion energy is observed for poly(acrylic acid) (PAA) modified Cu/TaN interfaces in which the thin copper films are deposited by the hydrogen assisted reduction of ...
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