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    Effect of Warpage of Flip Chip Packages Due to the Underfill Encapsulating Process on Interconnect Reliability 

    Source: Journal of Electronic Packaging:;2009:;volume( 131 ):;issue: 003:;page 31005
    Author(s): Satoru Katsurayama; Hironori Tohmyoh
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In flip chip packages, it is common practice for interconnects to be encapsulated with a liquid underfill material. This paper describes the effects of different underfill processes, i.e., the ...
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    Thermal Opening Technique for Nondestructive Evaluation of Closed Cracks 

    Source: Journal of Pressure Vessel Technology:;2007:;volume( 129 ):;issue: 001:;page 103
    Author(s): Hironori Tohmyoh; Masumi Saka; Yuichi Kondo
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper describes the “thermal opening technique” for enhancing the ultrasonic response of a tightly closed crack. In this approach, thermal stress is generated by cooling the part locally ...
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    Analysis of Solderless Press-Fit Interconnections During the Assembly Process 

    Source: Journal of Electronic Packaging:;2008:;volume( 130 ):;issue: 003:;page 31007
    Author(s): Hironori Tohmyoh; Jiro Utsunomiya; Yoshikatsu Nakano; Takeshi Nakamura; Kiichiro Yamanobe; Masumi Saka
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper deals with typical mechanical problems that are encountered in a solderless press-fit assembly process. First, the elastic-plastic properties of two types of press-fit pins and the ...
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