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    A Modeling Approach for Predicting the Abrasive Particle Motion During Chemical Mechanical Polishing 

    Source: Journal of Tribology:;2007:;volume( 129 ):;issue: 004:;page 933
    Author(s): Elon J. Terrell; C. Fred Higgs III
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Chemical mechanical polishing (CMP) is a manufacturing process in which a wafer surface is polished by pressing it against a rotating pad that is flooded with slurry. The slurry itself is a ...
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    A Particle-Augmented Mixed Lubrication Modeling Approach to Predicting Chemical Mechanical Polishing 

    Source: Journal of Tribology:;2009:;volume( 131 ):;issue: 001:;page 12201
    Author(s): Elon J. Terrell; C. Fred Higgs
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Chemical mechanical polishing (CMP) is a manufacturing process that is commonly used to planarize integrated circuits and other small-scale devices during fabrication. Although a number of models ...
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