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High-Speed Scanning of Piezo-Probes for Nano-fabrication
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Low scanning speed of piezo-probes has been a fundamental limitation of scanning probe based nano-fabrication techniques. Typical scan-rates achieved are limited, by structural vibrations of the ...
Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: This article studies ultra-high-precision positioning with piezoactuators and illustrates the results with an example Scanning Probe Microscopy (SPM) application. Loss of positioning precision in ...
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