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    High-Speed Scanning of Piezo-Probes for Nano-fabrication 

    Source: Journal of Manufacturing Science and Engineering:;1998:;volume( 120 ):;issue: 003:;page 617
    Author(s): D. Croft; D. McAllister; S. Devasia
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Low scanning speed of piezo-probes has been a fundamental limitation of scanning probe based nano-fabrication techniques. Typical scan-rates achieved are limited, by structural vibrations of the ...
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    Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application 

    Source: Journal of Dynamic Systems, Measurement, and Control:;2001:;volume( 123 ):;issue: 001:;page 35
    Author(s): D. Croft; G. Shed; S. Devasia
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This article studies ultra-high-precision positioning with piezoactuators and illustrates the results with an example Scanning Probe Microscopy (SPM) application. Loss of positioning precision in ...
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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