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RISAnalysis of Pull-In Parameters of a Microelectromechanical Beam With van der Waals Force Using Modified Couple Stress Theory
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: This study investigates the pull-in parameters of a microcantilever beam influenced by electrostatic and van der Waals forces in microelectromechanical system (MEMS) devices. The classical continuum theory (CCMT) is ...