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RISNanoindentation Hardness Tests Using a Point Contact Microscope
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: The Point Contact Microscope (PCM), developed in NTT’s Kaneko Research Laboratory, is used to conduct hardness tests on polycarbonate and gold at indentation depths in the range of about 5-100 ...
Comments on “Discussion of ‘Simultaneous Measurement of Surface Topography and Friction Force by a Single-Head Lateral Force Microscope’” (1995, ASME J. Tribol., 117, p. 340)
Publisher: The American Society of Mechanical Engineers (ASME)
Simultaneous Measurement of Surface Topography and Friction Force by a Single-Head Lateral Force Microscope
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Although friction force measurements using one sensor to detect both the normal deflection and rotation angle of a scanning probe are convenient and popular, the critical issues regarding the ...
Development of a New Tip Assembly for Lateral Force Microscopy and Its Application to Thin Film Magnetic Media
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: In a Lateral Force Microscope (LFM), appropriate spring constants of the tip assembly are essential for obtaining proper normal loads for wear or scratch tests and good lateral force signals. ...
Dependence of Nano-Friction and Nano-Wear on Loading Force for Sharp Diamond Tips Sliding on Si, Mn-Zn Ferrite, and Au
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Microscopic friction and wear were measured on both the original top surfaces and freshly worn surfaces of three solid materials including a silicon wafer, a Mn-Zn ferrite block and an Au ...