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    Die Cracking at Solder (In60-Pb40) Joints on Brittle (GaAs) Chips: Fracture Correlation Using Critical Bimaterial Interface Corner Stress Intensities 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 003:;page 369
    Author(s): Bingzhi Su; Y. C. Lee; Martin L. Dunn
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: We study cracking from the interface of an In60-Pb40 solder joint on a brittle GaAs die when the joint is subjected to a uniform temperature change. Our primary objective is to apply and ...
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