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    Deformation Mechanism of Two-Phase Solder Column Interconnections Under Highly Accelerated Thermal Cycling Condition: An Experimental Study 

    Source: Journal of Electronic Packaging:;1997:;volume( 119 ):;issue: 003:;page 189
    Author(s): B. Han
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermomechanical behavior of solder interconnections of a ceramic column grid array package assembly is characterized by high sensitivity moiré interferometry. The in situ thermal deformations of ...
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    Thermal Deformation Analysis of Various Electronic Packaging Products by Moiré and Microscopic Moiré Interferometry 

    Source: Journal of Electronic Packaging:;1995:;volume( 117 ):;issue: 003:;page 185
    Author(s): B. Han; Y. Guo
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermo-mechanical behavior of various levels of electronic packaging products is studied by moiré and microscopic moiré interferometry. The global deformations of packages with complex geometries ...
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    Flip-Chip BGA Design to Avert Die Cracking 

    Source: Journal of Electronic Packaging:;2001:;volume( 123 ):;issue: 001:;page 58
    Author(s): J.-B. Han
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Fracture mechanics is applied to flip-chip BGA design to avert die cracking from its backside. Fracture mechanics is integrated with the finite element analysis (FEA) and design of virtual ...
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    Warpage Measurement on Dielectric Rough Surfaces of Microelectronics Devices by Far Infrared Fizeau Interferometry1 

    Source: Journal of Electronic Packaging:;2000:;volume( 122 ):;issue: 003:;page 227
    Author(s): K. Verma; B. Han
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Far infrared Fizeau interferometry is developed and it is proposed as a tool for warpage measurement of microelectronics devices. The method provides a whole-field map of surface topography with ...
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    Micro-Mechanical Deformation Analysis of Surface Laminar Circuit in Organic Flip-Chip Package: An Experimental Study 

    Source: Journal of Electronic Packaging:;2000:;volume( 122 ):;issue: 004:;page 294
    Author(s): B. Han; P. Kunthong
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermo-mechanical deformations of microstructures in a surface laminar circuit (SLC) substrate are quantified by microscopic moiré interferometry. Two specimens are analyzed; a bare SLC substrate ...
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    Bending Analysis of Simply Supported Shear Deformable Skew Plates 

    Source: Journal of Engineering Mechanics:;1997:;Volume ( 123 ):;issue: 003
    Author(s): K. M. Liew; J.-B. Han
    Publisher: American Society of Civil Engineers
    Abstract: This paper presents the bending analysis of a simply supported, thick skew plate based on the first-order shear deformation Reissner/Mindlin theory. Using the geometric transformation, the governing differential equations ...
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    Analysis of Moderately Thick Circular Plates Using Differential Quadrature Method 

    Source: Journal of Engineering Mechanics:;1997:;Volume ( 123 ):;issue: 012
    Author(s): J.-B. Han; K. M. Liew
    Publisher: American Society of Civil Engineers
    Abstract: In this paper, the axisymmetric bending analysis of moderately thick circular plates based on the Reissner-Mindlin plate theory is conducted numerically by using the differential quadrature (DQ) method. The governing ...
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    Bending Solution for Thick Plates with Quadrangular Boundary 

    Source: Journal of Engineering Mechanics:;1998:;Volume ( 124 ):;issue: 001
    Author(s): K. M. Liew; J.-B. Han
    Publisher: American Society of Civil Engineers
    Abstract: A numerical solution technique, which is based on the differential quadrature method, is presented for investigation of the static characteristics of thick Reissner/Mindlin plates on quandrangular planforms. The basic idea ...
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    Verification of Numerical Models Used in Microelectronics Packaging Design by Interferometric Displacement Measurement Methods 

    Source: Journal of Electronic Packaging:;1996:;volume( 118 ):;issue: 003:;page 157
    Author(s): B. Han; Y. Guo; C. K. Lim; D. Caletka
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Verified/predictive modeling has become an integral part of electronic packaging product development in order to reduce costs and cycle time. In this paper, interferometric displacement measurement ...
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    The Strength of the Silicon Die in Flip-Chip Assemblies 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 001:;page 114
    Author(s): B. Cotterell; Z. Chen; J.-B. Han; N.-X. Tan
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The mechanical reliability of silicon dies is affected by the defects introduced by surface grinding and edge dicing. The ring-on-ring and the four-point-bend test have been used in this study ...
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