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RISInfluence of Local Material Properties on the Nonlinear Dynamic Behavior of an Atomic Force Microscope Probe
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: In this paper, a study of the characteristics of period-doubling bifurcations in the dynamic behavior of an atomic force microscope probe for off-resonance excitation is presented. Using a ...
Utilizing Off-Resonance and Dual-Frequency Excitation to Distinguish Attractive and Repulsive Surface Forces in Atomic Force Microscopy
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: A beam model is developed and discretized to study the dynamic behavior of the cantilever probe of an atomic force microscope. Atomic interaction force models are used with a multimode ...
Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Displacement measurement in atomic force microscopy (AFM) is most commonly obtained indirectly by measuring the slope of the AFM probe and applying a calibration factor. Static calibration ...
Localization in Microresonator Arrays: Influence of Natural Frequency Tuning
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Intrinsic localized modes are localization events caused by intrinsic nonlinearities within an array of perfectly periodic coupled oscillators. Recent developments in microscale fabrication techniques ...