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    Modeling of Interfacial Delamination in Plastic IC Packages Under Hygrothermal Loading 

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 003:;page 268
    Author(s): Andrew A. Tay
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Ever since the discovery of the “popcorn” failure of plastic-encapsulated integrated-circuit (IC) packages in the 1980s, much effort has been devoted to understanding the failure mechanism and ...
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