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    Stresses and Fracture at the Chip/Underfill Interface in Flip-Chip Assemblies 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 001:;page 44
    Author(s): Ji Eun Park; Iwona Jasiuk; Alek Zubelewicz
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: We study stresses and fracture due to temperature change in a flip-chip assembly at the chip/underfill interface for various thermo-mechanical properties of underfill and the device’s geometry. ...
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