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    Issues for Construction of 300-mm Fab

    Source: Journal of Construction Engineering and Management:;2000:;Volume ( 126 ):;issue: 006
    Author:
    Allan D. Chasey
    ,
    Saloni Merchant
    DOI: 10.1061/(ASCE)0733-9364(2000)126:6(451)
    Publisher: American Society of Civil Engineers
    Abstract: The cost of constructing and tooling a semiconductor facility, which is currently more than $1 billion, is expected to double by the year 2000, driving semiconductor chip manufacturers to adopt strategies to minimize cost to maximize the return on investment. What seems to be an inevitable transition to the larger, 300-mm wafer will have a widespread impact with massive economic implications. Preliminary tool designs and process approach standards suggest increased automation of material handling and storage systems, increases in utility consumption, tool height and weight requirements, and schedule compression. Moreover, the contamination sensitivity of the 300-mm wafer might require modification in the fab construction protocol, which in turn could affect labor productivity. Such changes will have a significant impact on construction methods, materials, and management techniques. This paper discusses the key areas in which research is necessary, focusing mainly on issues that have the maximum impact on design and construction of 300-mm fabs. While not providing solutions, this paper is intended to act as a catalyst for further research as 300-mm technology moves closer to becoming a reality.
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      Issues for Construction of 300-mm Fab

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    contributor authorAllan D. Chasey
    contributor authorSaloni Merchant
    date accessioned2017-05-08T22:41:40Z
    date available2017-05-08T22:41:40Z
    date copyrightDecember 2000
    date issued2000
    identifier other%28asce%290733-9364%282000%29126%3A6%28451%29.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/86745
    description abstractThe cost of constructing and tooling a semiconductor facility, which is currently more than $1 billion, is expected to double by the year 2000, driving semiconductor chip manufacturers to adopt strategies to minimize cost to maximize the return on investment. What seems to be an inevitable transition to the larger, 300-mm wafer will have a widespread impact with massive economic implications. Preliminary tool designs and process approach standards suggest increased automation of material handling and storage systems, increases in utility consumption, tool height and weight requirements, and schedule compression. Moreover, the contamination sensitivity of the 300-mm wafer might require modification in the fab construction protocol, which in turn could affect labor productivity. Such changes will have a significant impact on construction methods, materials, and management techniques. This paper discusses the key areas in which research is necessary, focusing mainly on issues that have the maximum impact on design and construction of 300-mm fabs. While not providing solutions, this paper is intended to act as a catalyst for further research as 300-mm technology moves closer to becoming a reality.
    publisherAmerican Society of Civil Engineers
    titleIssues for Construction of 300-mm Fab
    typeJournal Paper
    journal volume126
    journal issue6
    journal titleJournal of Construction Engineering and Management
    identifier doi10.1061/(ASCE)0733-9364(2000)126:6(451)
    treeJournal of Construction Engineering and Management:;2000:;Volume ( 126 ):;issue: 006
    contenttypeFulltext
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