Show simple item record

contributor authorCruz-Alonso, Ángel
contributor authorTerroba, Félix
contributor authorCuesta-Infante, Alfredo
date accessioned2026-08-23T07:54:33Z
date available2026-08-23T07:54:33Z
date copyright2026/04/01
date issued2026
identifier issn1530-9827
identifier otherjcise-25-1392.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4315785
description abstractAbstract. Thin-walled structures are ubiquitous in industries such as automotive, civil engineering, consumer electronics, or medical devices; and many times these structures, or a significant part of them, can be approximated by a plate as in aerospace and shipbuilding. In order to prevent damages and increase safety, “on-condition” maintenance is increasingly being used due to the nowadays ability to continuously sensing and processing data in real time. A key feature to assess the probability of damage is the strain caused by loads. In this article, our goal is to estimate the strain in the whole structure based on measurements that only capture a 1.2% of its total surface. We show that the problem is equivalent to reconstructing an image with 98.8% missing pixels and present a novel procedure referred to as the recurrent inpainting model (RIM). We use finite element methods to simulate a thin-walled structure under different loads and create a large data set of instances. Then, we use RIM to carry out the reconstruction task along with tests of robustness against sensor failure, transferability to other sensor morphologies, and generalization to 3D hollow structures. The results in all the tasks clearly outrank the next best deep learning architecture.
publisherThe American Society of Mechanical Engineers (ASME)
titleFull Strain Matrix Estimation in Thin-Walled Structures With Recurrent Inpainting Model
typeJournal Paper
journal volume26
journal issue4
journal titleJournal of Computing and Information Science in Engineering
identifier doi10.1115/1.4071388
journal fristpage1848
journal lastpage1859
page12
treeJournal of Computing and Information Science in Engineering:;2026:;volume( 026 ):;issue:004
contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record