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contributor authorBhatt, Prahar M.
contributor authorMalhan, Rishi K.
contributor authorRajendran, Pradeep
contributor authorShah, Brual C.
contributor authorThakar, Shantanu
contributor authorYoon, Yeo Jung
contributor authorGupta, Satyandra K.
date accessioned2022-02-05T22:32:24Z
date available2022-02-05T22:32:24Z
date copyright2/9/2021 12:00:00 AM
date issued2021
identifier issn1530-9827
identifier otherjcise_21_4_040801.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4277722
description abstractAutomatically detecting surface defects from images is an essential capability in manufacturing applications. Traditional image processing techniques are useful in solving a specific class of problems. However, these techniques do not handle noise, variations in lighting conditions, and backgrounds with complex textures. In recent times, deep learning has been widely explored for use in automation of defect detection. This survey article presents three different ways of classifying various efforts in literature for surface defect detection using deep learning techniques. These three ways are based on defect detection context, learning techniques, and defect localization and classification method respectively. This article also identifies future research directions based on the trends in the deep learning area.
publisherThe American Society of Mechanical Engineers (ASME)
titleImage-Based Surface Defect Detection Using Deep Learning: A Review
typeJournal Paper
journal volume21
journal issue4
journal titleJournal of Computing and Information Science in Engineering
identifier doi10.1115/1.4049535
journal fristpage040801-1
journal lastpage040801-15
page15
treeJournal of Computing and Information Science in Engineering:;2021:;volume( 021 ):;issue: 004
contenttypeFulltext


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