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contributor authorKung, Huang-Kuang
contributor authorHsieh, Chi-Lung
date accessioned2017-11-25T07:21:05Z
date available2017-11-25T07:21:05Z
date copyright2017/27/7
date issued2017
identifier issn1043-7398
identifier otherep_139_04_041002.pdf
identifier urihttp://138.201.223.254:8080/yetl1/handle/yetl/4236872
description abstractOverhang and/or pyramid stacked packages are the trend in the semiconductor industry. As the stacked layers increase drastically, the wire sweep and wire sag problems become more and more serious. Based on some types of frequently used stacked configurations, their corresponding wire sweep and wire sag stiffness and deflections are investigated for extra-high stacked layers. Two typical profiles of Q_loop and S_loop wire bonds are included in this study. However, wire sweep and wire sag have to be considered in two different design aspects. For wire sweep, we have the conclusion that the maximum wire sweep deflections always occur near the central segment of a wire bond. As for the wire sag, the maximum wire sag may take place in the center region of the straight portion of a wire bond. The result shows that the deflections of wire sag can be reduced significantly by simply shifting the position of the kink or bend created within a wire bond. Finally, we have concluded that a stacked configuration with smallest bond span may be the preferred selection for the concerns of wire sweep and wire sag issues.
publisherThe American Society of Mechanical Engineers (ASME)
titleEffects of Stacked Layers and Stacked Configurations on Wire Sweep and Wire Sag of Advanced Overhang/Pyramid Stacked Packages
typeJournal Paper
journal volume139
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4037276
journal fristpage41002
journal lastpage041002-8
treeJournal of Electronic Packaging:;2017:;volume( 139 ):;issue: 004
contenttypeFulltext


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