| contributor author | Garcia, Philip | |
| contributor author | Offutt, Susan E. | |
| contributor author | Pinar, Musa | |
| contributor author | Changnon, Stanley A. | |
| date accessioned | 2017-06-09T14:01:55Z | |
| date available | 2017-06-09T14:01:55Z | |
| date copyright | 1987/09/01 | |
| date issued | 1987 | |
| identifier issn | 0733-3021 | |
| identifier other | ams-11218.pdf | |
| identifier uri | http://onlinelibrary.yabesh.ir/handle/yetl/4146422 | |
| description abstract | This study explores the relationships between U.S. corn yields (level and stability), advances in technology, and weather. Evaluations at the farm, sub-state, and national levels reveal no evidence of yield plateaus, and absolute, but not relative, yield variability increased over time. When yield behavior is adjusted for weather, variances are more likely to be equal between early and late periods. Results suggest that technology has not been the only determinant of changing yield risk, and emphasize the importance of weather conditions in assessing them effects. | |
| publisher | American Meteorological Society | |
| title | Corn Yield Behavior: Effects of Technological Advance and Weather-Conditions | |
| type | Journal Paper | |
| journal volume | 26 | |
| journal issue | 9 | |
| journal title | Journal of Climate and Applied Meteorology | |
| identifier doi | 10.1175/1520-0450(1987)026<1092:CYBEOT>2.0.CO;2 | |
| journal fristpage | 1092 | |
| journal lastpage | 1102 | |
| tree | Journal of Climate and Applied Meteorology:;1987:;Volume( 026 ):;Issue: 009 | |
| contenttype | Fulltext | |