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contributor authorHamian, Sina
contributor authorGauffreau, Andrew M.
contributor authorWalsh, Timothy
contributor authorLee, Jungchul
contributor authorPark, Keunhan
date accessioned2017-05-09T01:30:18Z
date available2017-05-09T01:30:18Z
date issued2016
identifier issn0022-1481
identifier otherht_138_05_052401.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/161575
description abstractThis paper reports the frequencydependent electrothermal behaviors of a freestanding dopedsilicon heated microcantilever probe operating under periodic (ac) Joule heating. We conducted a frequencydomain finiteelement analysis (FEA) and compared the steady periodic solution with 3د‰ experiment results. The computed thermal transfer function of the cantilever accurately predicts the ac electrothermal behaviors over a full spectrum of operational frequencies, which could not be accomplished with the 1D approximation. In addition, the thermal transfer functions of the cantilever in vacuum and in air were compared, through which the frequencydependent heat transfer coefficient of the air was quantified. With the developed FEA model, design parameters of the cantilever (i.e., the size and the constriction width of the cantilever heater) and their effects on the ac electrothermal behaviors were carefully investigated. Although this work focused on dopedSi heated microcantilever probes, the developed FEA model can be applied for the ac electrothermal analysis of general microelectromechanical systems.
publisherThe American Society of Mechanical Engineers (ASME)
titleElectrothermal Characterization of Doped Si Heated Microcantilevers Under Periodic Heating Operation
typeJournal Paper
journal volume138
journal issue5
journal titleJournal of Heat Transfer
identifier doi10.1115/1.4032531
journal fristpage52401
journal lastpage52401
identifier eissn1528-8943
treeJournal of Heat Transfer:;2016:;volume( 138 ):;issue: 005
contenttypeFulltext


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