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contributor authorvan der Tempel, Leendert
date accessioned2017-05-09T01:30:17Z
date available2017-05-09T01:30:17Z
date issued2016
identifier issn0022-1481
identifier otherht_138_05_051301.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/161572
description abstractA series expansion and an approximation have been derived for the temperature in the general case of transient heat conduction in two thin layers between two semiinfinite media at different uniform initial temperatures. The temperature accuracy and thermal effusivity measurement accuracy have been mapped to establish a window of operation for direct thermal effusivity measurement by the modified transient plane source (MTPS) method. The presented temperature series enables quick thermal analysis of thermally thick and semithick samples without factory correction/calibration.
publisherThe American Society of Mechanical Engineers (ASME)
titleTemperature Solution for Transient Heat Conduction in a Thin Bilayer Between Semi Infinite Media in Thermal Effusivity Measurement
typeJournal Paper
journal volume138
journal issue5
journal titleJournal of Heat Transfer
identifier doi10.1115/1.4032434
journal fristpage51301
journal lastpage51301
identifier eissn1528-8943
treeJournal of Heat Transfer:;2016:;volume( 138 ):;issue: 005
contenttypeFulltext


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