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contributor authorCheng, Huanyu
contributor authorWang, Shuodao
date accessioned2017-05-09T01:04:48Z
date available2017-05-09T01:04:48Z
date issued2014
identifier issn0021-8936
identifier otherjam_081_04_044501.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/153804
description abstractIn order to provide continuous diagnostic and therapeutic options that exploit electrophysiological signals from the epidermis, this study discusses epidermal electronics systems (EES) that conform to the skin surface via van der Waals force alone, which is otherwise susceptible to artifacts associated with motioninduced changes. This paper not only establishes a criterion of conformal contact between the EES and the skin for both initial contact and the case where the skin is subject to external loading but also investigates the criterion to prevent any partial delamination between electronics and the skin. These results improve the performance of EES by maximizing intimate contact between the EES and skin, revealing important underlying physical insights for device optimization and future design.
publisherThe American Society of Mechanical Engineers (ASME)
titleMechanics of Interfacial Delamination in Epidermal Electronics Systems
typeJournal Paper
journal volume81
journal issue4
journal titleJournal of Applied Mechanics
identifier doi10.1115/1.4025305
journal fristpage44501
journal lastpage44501
identifier eissn1528-9036
treeJournal of Applied Mechanics:;2014:;volume( 081 ):;issue: 004
contenttypeFulltext


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