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contributor authorKazoe, Yutaka
contributor authorYoda, Minami
date accessioned2017-05-09T00:58:55Z
date available2017-05-09T00:58:55Z
date issued2013
identifier issn0098-2202
identifier otherfe_135_2_021305.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/151829
description abstractMiniaturized flow systems have been developed for various applications, including integrated chemical analyses and thermal management of microelectronics. Understanding interfacial transport is important in designing and optimizing such flow systems, since surface effects become significant due to the large surface areas and small volumes at these length scales. Recently, various nearwall flow diagnostic techniques have been developed based on evanescentwave illumination. Since evanescent waves only illuminate the fluid in the region over the first few hundred nanometers next to the wall, these techniques have much better spatial resolution than conventional methods based on epifluorescence microscopy. This paper presents recent advances in evanescent wavebased flow diagnostics using fluorescent tracers, including evanescentwave particle velocimetry applied to flows driven by both pressure and voltage gradients and evanescentwave fluorescence, which has been used to measure nearwall liquid temperature and pH fields, as well as the surface charge, or wall خ¶potential, distributions.
publisherThe American Society of Mechanical Engineers (ASME)
titleEvanescent Wave Based Flow Diagnostics
typeJournal Paper
journal volume135
journal issue2
journal titleJournal of Fluids Engineering
identifier doi10.1115/1.4023448
journal fristpage21305
journal lastpage21305
identifier eissn1528-901X
treeJournal of Fluids Engineering:;2013:;volume( 135 ):;issue: 002
contenttypeFulltext


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