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contributor authorKim, Hogyoung
contributor authorSohn, Ahrum
contributor authorCho, Yunae
contributor authorKim, Dong
date accessioned2017-05-09T00:57:38Z
date available2017-05-09T00:57:38Z
date issued2013
identifier issn1528-9044
identifier otherep_135_1_011010.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/151407
description abstractThe temperaturedependent electrical properties of Ag Schottky contacts to differently grown Opolar bulk ZnO single crystals were comparatively investigated in the temperature range of 100–300 K. Schottky contact to hydrothermal ZnO produced the higher barrier heights (lower ideality factors) than that of pressurized meltgrown ZnO. The modified Richardson plots for two samples produced the larger Richardson constant compared to the theoretical value of 32 A cm−2 K−2 for ntype ZnO, indicating that the inhomogeneous barrier height with the thermionic emission (TE) model could not explain the current transport. The conductive accumulation layers on the ZnO surfaces might not be removed effectively for two samples, which degraded the rectifying characteristics. The different electron transport characteristics between hydrothermal and pressurized meltgrown ZnO could be explained by the different degree of AgO formation at the interface.
publisherThe American Society of Mechanical Engineers (ASME)
titleTemperature Dependent Electrical Characteristics of Ag Schottky Contacts to Differently Grown O Polar Bulk ZnO
typeJournal Paper
journal volume135
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4023404
journal fristpage11010
journal lastpage11010
identifier eissn1043-7398
treeJournal of Electronic Packaging:;2013:;volume( 135 ):;issue: 001
contenttypeFulltext


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