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contributor authorYasuhide Shindo
contributor authorFumio Narita
contributor authorKoji Sato
date accessioned2017-05-09T00:53:11Z
date available2017-05-09T00:53:11Z
date copyrightMay, 2012
date issued2012
identifier issn1050-0472
identifier otherJMDEDB-27962#051005_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/149784
description abstractThis paper studies the dynamic electromechanical response of piezoelectric mirrors driven by piezoelectric lead zirconate titanate (PZT) thick films both numerically and experimentally. The resonant frequency and the mirror tilt angle of piezoelectric mirrors under ac electric fields were analyzed by three-dimensional finite element method. The dynamic electromechanical field concentrations due to electrodes were also simulated and the results were discussed in detail. The mirrors consisted of four partially poled PZT unimorphs. The resonant frequency was then measured, and a comparison was made between the analysis and the experiment. The finite element method is shown to be capable of estimating the electromechanical field concentrations in the PZT films, making it a useful tool for designing future microelectromechanical systems (MEMS) mirrors.
publisherThe American Society of Mechanical Engineers (ASME)
titleDynamic Electromechanical Field Concentrations Near Electrodes in Piezoelectric Thick Films for the Design of MEMS Mirrors
typeJournal Paper
journal volume134
journal issue5
journal titleJournal of Mechanical Design
identifier doi10.1115/1.4006265
journal fristpage51005
identifier eissn1528-9001
keywordsElectric fields
keywordsThick films
keywordsMicroelectromechanical systems
keywordsDesign
keywordsElectrodes
keywordsMirrors AND Finite element analysis
treeJournal of Mechanical Design:;2012:;volume( 134 ):;issue: 005
contenttypeFulltext


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