| contributor author | Naoya Tada | |
| contributor author | Akira Funakoshi | |
| contributor author | Hiroki Ishikawa | |
| contributor author | Makoto Uchida | |
| date accessioned | 2017-05-09T00:46:43Z | |
| date available | 2017-05-09T00:46:43Z | |
| date copyright | February, 2011 | |
| date issued | 2011 | |
| identifier issn | 0094-9930 | |
| identifier other | JPVTAS-28540#014502_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/147520 | |
| description abstract | A method for identification of a semi-elliptical crack on the back surface of metal plate by means of direct-current electrical potential difference method (DC-PDM) of multiple-point measurement type was proposed by the authors previously. Geometry of the crack was given by the two-dimensional location of the crack center, the surface and inward angles of the crack, and the length and depth of the crack. In this paper, experiments on the crack identification were carried out using six metal plates with different geometries of semi-elliptical cracks made on the back surface by electric discharge machining. Geometrical parameters of the crack were evaluated by the proposed method. The result of identification was successful and it was clarified that the semi-elliptical crack on the back surface can be identified nondestructively by dc-PDM of multiple-point measurement type. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Experimental Study of Three-Dimensional Identification of Semi-Elliptical Crack on the Back Surface by Means of Direct-Current Electrical Potential Difference Method of Multiple-Point Measurement Type | |
| type | Journal Paper | |
| journal volume | 133 | |
| journal issue | 1 | |
| journal title | Journal of Pressure Vessel Technology | |
| identifier doi | 10.1115/1.4001918 | |
| journal fristpage | 14502 | |
| identifier eissn | 1528-8978 | |
| keywords | Electric potential | |
| keywords | Fracture (Materials) AND Pulse width modulation | |
| tree | Journal of Pressure Vessel Technology:;2011:;volume( 133 ):;issue: 001 | |
| contenttype | Fulltext | |
