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contributor authorChristoph Heinle
contributor authorMartina Vetter
contributor authorGottfried W. Ehrenstein
contributor authorDietmar Drummer
date accessioned2017-05-09T00:39:16Z
date available2017-05-09T00:39:16Z
date copyrightOctober, 2010
date issued2010
identifier issn1087-1357
identifier otherJMSEFK-28406#054505_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/144016
description abstractOffering a large variety of options, assembly injection molding represents an innovative and highly integrative technique of manufacturing mechatronic systems. This is due to the fact that it combines many technical functions such as casings and sealing of several elements made of different materials in one single manufacturing process. Particularly, the combination of various materials is a significant technological benefit and a big challenge at the same time. System tightness is a major target. This paper presents a model to improve the understanding of how leaking occurs and of the mechanisms underlying such as shrinkage and warpage behaviors related to material, process, and design. It shall also be the basis for investigations on the phenomena and development of strategies to improve the systems produced by assembly molding in terms of media tightness. Very important are the complex interaction and intereffects acting on thermal and structural shrinkages, the elements’ warpage entailed, and the adhesion between them.
publisherThe American Society of Mechanical Engineers (ASME)
titleAssembly Molding of Tight Mechatronic System - A Model Approach
typeJournal Paper
journal volume132
journal issue5
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.4002547
journal fristpage54505
identifier eissn1528-8935
keywordsTemperature
keywordsMetals
keywordsManufacturing
keywordsMolding
keywordsPressure
keywordsShrinkage (Materials)
keywordsWarping
keywordsMechanisms
keywordsLeakage
keywordsDesign
keywordsInjection molding AND Flow (Dynamics)
treeJournal of Manufacturing Science and Engineering:;2010:;volume( 132 ):;issue: 005
contenttypeFulltext


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